NM01TGM56DL

This SIUI single crystal ultrasonic probe is specifically designed for use with ultrasonic thickness gauges. The "D" in the description indicates that this is a delay line probe, part of SIUI's wide frequency series. It features a center frequency of 5 MHz, a crystal diameter of 6mm, and a Lemo 00 connector for secure and reliable connection to compatible SIUI or other thickness gauging instruments. Delay line probes are particularly useful for enhancing near-surface resolution, measuring thin materials, and for applications where the transducer needs to be isolated from the test surface (e.g., high temperature).

Key Features:

• Single Crystal Transducer: Employs a single piezoelectric crystal element for both transmitting and receiving ultrasonic pulses.

• Delay Line Probe (D): Incorporates a replaceable or integrated delay line between the transducer element and the test surface. This delay line offers several advantages:

  • Improved Near-Surface Resolution: By introducing a time delay, the initial pulse and any interface echoes are separated from the echoes originating from very thin materials or near-surface flaws.

  • Measurement of Thin Materials: Enables accurate measurement of very thin materials that might otherwise be difficult to resolve with direct contact probes.

  • Surface Isolation: Protects the transducer element from wear and tear on rough surfaces and can be used to couple sound into curved or complex geometries more effectively.

  • Potential for High-Temperature Applications: The delay line can act as a thermal barrier, allowing for brief measurements on hot surfaces (when used with appropriate high-temperature couplant and within the delay line's temperature limits).

• Wide Frequency Series: Indicates that this probe is designed to operate effectively over a broader range of frequencies, potentially offering versatility for different material types and measurement requirements.

• Center Frequency: 5 MHz: The 5 MHz frequency provides a good balance between resolution and penetration for many common industrial materials and thickness ranges. It offers higher resolution than lower frequency probes, making it suitable for detecting smaller variations in thickness.

• Crystal Diameter: 6mm: The 6mm crystal size influences the beam characteristics, providing a focused sound beam suitable for localized thickness measurements.

• Lemo 00 Connector: Features a Lemo 00 connector, a small and robust connector type commonly used for ultrasonic transducers, ensuring a secure and reliable electrical connection to the thickness gauge.

• SIUI Manufacturing: Manufactured by SIUI (Shantou Institute of Ultrasonic Instruments), a reputable producer of ultrasonic testing and measurement equipment, guaranteeing quality and performance.

Applications:

• Precise thickness measurement of thin-walled components.

• Measurement of materials with coatings (in some cases, depending on the gauge's capabilities and settings).

• Inspection for near-surface flaws or defects in thin materials.

• Thickness gauging of small diameter pipes or curved surfaces.

• Applications where improved near-surface resolution is critical.

• Potentially suitable for limited high-temperature thickness measurements with appropriate precautions and accessories.

Importance:

• Enables Precise Measurement of Thin Materials: The delay line feature is crucial for accurately measuring very thin components.

• Improves Near-Surface Defect Detection: The separation of initial echoes enhances the ability to detect flaws close to the material surface.

• Provides Reliable Connection: The Lemo 00 connector ensures a secure and noise-free signal transmission.

• Offers Versatility: The wide frequency series design may allow for adaptability to different materials and applications.