NM0150L320.6105P2

The SIUI 5L32-0.6×10-5-P2 is a high-performance standard linear array phased array ultrasonic testing (PAUT) probe designed for precise flaw detection and characterization. This probe utilizes advanced phased array technology, enabling electronic control of the ultrasonic beam for beam steering, focusing, and improved inspection capabilities.

Key Features and Benefits:

• Linear Array Configuration:

  • Features a linear arrangement of 32 elements, providing excellent coverage and flexibility for various inspection applications.

• Optimal Frequency:

  • Operates at a frequency of 5 MHz, offering a balanced combination of penetration depth and resolution, making it suitable for a wide range of materials and inspection scenarios.

• Precise Element Pitch:

  • Features a 0.6 mm element pitch, allowing for high-resolution imaging and accurate flaw detection.

• 10 mm Elevation:

  • Provides a 10 mm elevation, enhancing the probe's sensitivity and enabling effective inspection of thicker materials.

• Robust P2 Case:

  • Encased in a durable P2 case, ensuring protection and longevity in demanding industrial environments.

• Long Cable Length:

  • Equipped with a 5-meter cable, providing ample reach and flexibility for inspections in various locations.

• Iplex Connector:

  • Utilizes an Iplex connector, ensuring a secure and reliable connection to SIUI and compatible PAUT instruments.

• Versatile Application:

  • Suitable for a wide range of PAUT applications, including weld inspection, flaw detection in pipes and plates, corrosion mapping, and general-purpose inspections.

• SIUI Quality:

  • Manufactured by SIUI, a reputable provider of NDT equipment, ensuring reliable performance and durability.

SIUI Probe: