NM0132N00L20

The SIUI Phased Array Wedge, identified by the part number 32N00L-20, is a specialized accessory designed for use with compatible phased array ultrasonic probes. This wedge functions as a 20mm delay block, creating a standoff between the probe and the test surface. This standoff is crucial in various phased array applications, particularly for near-surface resolution enhancement, high-temperature inspections (by dissipating heat), or when specific acoustic path lengths are required. The term "block wedge" indicates its solid construction and its role in coupling the phased array probe to the test surface.

Key Features:

• Phased Array Compatibility: Specifically engineered for seamless integration with SIUI or other compatible phased array ultrasonic testing (PAUT) probes.

• 20mm Delay Line: Features a built-in 20mm thick delay line (or standoff). This delay allows the initial pulse and near-surface noise to dissipate before the signals from deeper within the material are received, improving near-surface resolution.

• Block Wedge Design: The solid construction ensures consistent acoustic coupling between the probe and the delay line, and between the delay line and the test surface.

• Zero Degree (Longitudinal Wave) Coupling: The "N00L" in the part number typically indicates that this wedge is designed for transmitting longitudinal waves (L-waves) at a 0-degree nominal angle into the test material. This is common for thickness gauging, lamination detection, and other applications where a straight beam is required.

• Acoustic Properties: The delay line material is chosen for its specific acoustic velocity and attenuation characteristics to optimize performance for the intended applications.

• SIUI Quality Manufacturing: Manufactured by SIUI (Shantou Institute of Ultrasonic Instruments), a reputable producer of ultrasonic testing equipment and accessories, ensuring quality and compatibility with their probes and systems.

Applications:

• Phased array ultrasonic thickness gauging.

• Detection of near-surface flaws and laminations.

• Inspection of materials with rough surfaces where a standoff improves coupling.

• High-temperature ultrasonic testing when used with appropriate high-temperature couplant and considering the delay line's temperature limitations.

• Applications requiring a specific time delay or acoustic path length.

Importance:

• Enhances Near-Surface Resolution: The delay line separates the initial pulse from near-surface reflections, improving the ability to detect flaws close to the surface.  

• Facilitates Thickness Measurement: Provides a stable and reliable method for accurate ultrasonic thickness measurements using phased array probes.

• Improves Coupling on Rough Surfaces: The delay line can conform better to slightly uneven surfaces compared to a direct probe contact.

• Enables High-Temperature Testing (with precautions): The delay line acts as a thermal barrier, allowing for short-duration inspections on hot surfaces.