NM01P124L

The SIUI Normal Probe, belonging to their Mid Frequency Bandwidth Series, is a single-element ultrasonic transducer designed for straight beam testing across a variety of materials. This probe features a center frequency of 1 MHz and a crystal diameter of 24 millimeters (approximately 0.94 inches). It is equipped with a Lemo 00 connector for secure and reliable connection to compatible SIUI or other ultrasonic flaw detectors and thickness gauges. Normal probes are fundamental tools for detecting defects that are oriented parallel to the sound beam (perpendicular to the test surface), as well as for thickness measurement and material characterization. The Mid Frequency Bandwidth Series suggests a balance between sensitivity, resolution, and penetration depth for a range of inspection applications.

Key Features:

• Normal Probe Configuration: Designed for generating longitudinal waves that propagate perpendicular to the surface of the test material.

• Center Frequency: 1 MHz: This lower frequency offers excellent penetration capabilities in thicker or more attenuating materials, making it suitable for inspecting castings, forgings, and some composites. While penetration is prioritized, it still provides adequate sensitivity for detecting significant flaws.

• Crystal Diameter: 24 mm (0.94 inches): The larger 24 mm crystal diameter contributes to a more focused and less divergent sound beam in the far field, improving sensitivity to deeper reflectors. It also provides a larger acoustic footprint on the test surface.

• Mid Frequency Bandwidth Series: Indicates that this probe offers a moderate range of usable frequencies around its center frequency, providing a balance between sensitivity and axial resolution for a variety of inspection tasks.

• Lemo 00 Connector: Features a compact and widely compatible Lemo 00 connector, ensuring a secure and reliable electrical connection to the ultrasonic instrument.

• Direct Contact Testing: Designed for direct contact with the test surface, requiring the use of an appropriate ultrasonic couplant to facilitate efficient sound transmission into the material.

• Robust Construction: Manufactured by SIUI (Shantou Institute of Ultrasonic Instruments), a reputable producer of ultrasonic testing equipment, ensuring a durable and reliable probe for industrial inspection applications.

Applications:

• Inspection of thicker sections of various materials, including metals, plastics, and composites.

• Detection of deep-seated flaws such as voids, inclusions, and large cracks oriented perpendicular to the surface.

• Ultrasonic thickness gauging of thicker components.

• Material characterization and evaluation of acoustic properties in some applications.

• Inspection of castings and forgings where good penetration is required.

Importance:

• Excellent Penetration: The 1 MHz frequency is ideal for achieving good penetration in thicker and more attenuating materials.

• Improved Far-Field Sensitivity: The larger crystal diameter helps maintain a focused beam at greater depths.

• Reliable Connectivity: The Lemo 00 connector ensures a secure and stable connection to the instrument.

• Versatile for a Range of Materials: Suitable for inspecting a variety of materials where penetration is a key requirement.