NM01UD371

Experience robust performance and portability in your ultrasonic inspections with the OKO-NDT UD3-71 Ultrasonic Flaw Detector. This compact and lightweight device is engineered for precise detection and characterization of defects in a wide range of materials, making it an ideal choice for weld inspection, rail testing, and general industrial NDT applications.

The UD3-71 boasts a bright, high-contrast color TFT display, ensuring excellent visibility of A-scan and B-scan data even in challenging lighting conditions. With a broad test range from 1 to 6000 mm and a wide receiver bandwidth of 0.4-20 MHz, it offers the versatility needed to inspect various material thicknesses and types. The intuitive interface and direct digital display of flaw depth and distance facilitate rapid and accurate defect assessment.

Equipped with an 8 GB Micro SD card for extensive data storage, the UD3-71 allows for saving numerous testing setups and results, streamlining your documentation and reporting. Its durable design is rated to IP65, providing excellent protection against dust and water ingress, ensuring reliable operation in harsh field environments. Lightweight and easy to handle, the OKO-NDT UD3-71 is an indispensable tool for NDT professionals seeking efficient, accurate, and dependable flaw detection.

Key Features & Benefits:

• Compact & Lightweight: Weighing only 0.8 kg (1.76 lbs), it's highly portable for field operations.

• High-Brightness Color TFT Display: Ensures clear A-scan and B-scan visualization in diverse lighting.

• Wide Test Range: Capable of inspecting materials from 1 mm to 6000 mm depth.

• Broadband Receiver (0.4-20 MHz): Compatible with a wide range of probes for various applications.

• Internal 8 GB Micro SD Card: Ample memory for saving configurations, A-scans, and B-scan data.

• IP65 Environmental Protection: Dust-tight and resistant to water jets for reliable use in challenging environments.

• DAC/TCG & DGS Functions: Advanced features for precise sensitivity calibration and equivalent defect sizing.

• Versatile Measurement Gates: Two independent three-level gates for accurate amplitude and TOFD measurements.