NM01DK537EEEWSM

Experience Unmatched Durability and Performance: The Danatronics DK-537EE EW SM Dual Element Transducer!

The Danatronics DK-537EE EW SM is a high-performance dual element transducer engineered for exceptional durability and superior near-surface resolution in demanding ultrasonic testing applications. Featuring an Extended Wear (EW) design, a focused 5.0 MHz frequency, a compact 0.375 inch potted cable, and a robust K85 connector, this transducer is built to last and deliver precise results.

Key Features for Demanding Inspections:

• Extended Wear (EW) Design: Incorporates advanced materials and construction techniques to significantly enhance wear resistance, extending the lifespan of the transducer even in abrasive environments.

• Optimized Dual Element Configuration: Provides superior near-surface resolution and improved minimum measurable thickness compared to single element transducers, making it ideal for detecting shallow flaws and measuring thin materials.

• Versatile 5.0 MHz Frequency: Offers an excellent balance between penetration capability and high resolution for a wide range of materials and applications.

• Compact 0.375 inch Potted Cable: The durable potted cable design ensures secure and reliable connection while offering flexibility in tight spaces.

• Robust K85 Connector: Provides a secure and reliable connection to compatible Danatronics ultrasonic testing instruments.

• Danatronics Quality: Manufactured to the highest quality standards, ensuring consistent performance and long-term reliability.

Ideal for Applications Where:

• Transducer wear is a significant concern.

• High near-surface resolution is critical for detecting shallow defects.

• Accurate thickness measurements of thin materials are required.

• Reliable performance is needed in demanding industrial environments.

• Compatibility with Danatronics instruments and K85 connectors is essential.