
NM01225L321.0X10A32P2.5IPEX
The ULSO Linear Phased Array Probe is a sophisticated ultrasonic transducer designed for advanced non-destructive testing (NDT) applications. This probe features a linear array of 32 individual piezoelectric elements, each capable of being independently pulsed and controlled by a compatible phased array instrument. Operating at a center frequency of 2.25 MHz, this probe offers a balanced combination of penetration capability and resolution, making it suitable for inspecting a variety of materials and detecting subsurface discontinuities.
The probe has an element pitch of 1 mm, which is the center-to-center distance between adjacent elements. This parameter is crucial in determining the probe's beam steering capabilities and the potential for generating grating lobes at wider steering angles. The elevation of the probe, which is the dimension of the active area in the non-scanning direction, is 10 mm. This elevation influences the focusing and directivity of the ultrasonic beam in the elevational plane, contributing to the overall beam profile and sensitivity.
Encased in an A32 housing, this probe is designed for practical use in industrial environments. It is equipped with a 2.5-meter PVC cable, providing a flexible and durable connection to the ultrasonic instrument. Notably, the probe utilizes an IPEX connector. This type of miniature coaxial RF connector is often found in smaller electronic devices and might indicate compatibility with specific, potentially more compact or specialized phased array systems, as opposed to the more common industrial Lemo connectors.
Manufactured by ULSO, a likely provider of ultrasonic NDT equipment and accessories, this linear phased array probe enables advanced inspection techniques such as electronic scanning (sweeping the beam electronically without moving the probe) and beam steering (altering the angle of the ultrasonic beam). These capabilities allow for more efficient and comprehensive inspection of components, including weld inspections, corrosion mapping, and the detection and characterization of various types of flaws within the material volume.