NM0135600500

The Equotip Leeb impact device C is a key component of a portable hardness testing system utilizing the dynamic Leeb rebound method. This specific set includes the C-type impact body, designed for applications requiring lower impact energy, along with essential accessories for accurate and reliable hardness measurements.  

Components and Their Functions:

• Impact body C: This is the core of the measurement process. It houses a test tip made of a hard material (typically tungsten carbide) and a magnet. During operation, the impact body is propelled by a spring against the test surface. The rebound velocity of the impact body is then measured and correlated to the material's hardness value. The C-type impact body is characterized by its lower impact energy, making it suitable for testing:

  • Surface-hardened layers

  • Thin or impact-sensitive parts

  • Materials with lower mass

  • Polished surfaces

   

• Support rings D6 and D6a: These interchangeable support rings are placed around the impact point on the test surface. They ensure stable and perpendicular contact of the impact device with the material being tested, which is crucial for accurate readings, especially on flat surfaces. The inclusion of two different sizes (D6 and D6a) provides enhanced versatility for various testing geometries.  

• Cleaning brush D/DC/C/E/S: This brush is a vital accessory for maintaining the accuracy of the hardness testing process. It is used to clean the test tip of the impact body and the surface of the material being tested. Removing any dust, debris, or loose particles ensures proper contact and prevents interference with the impact and rebound of the test body. The designation indicates its compatibility with several Equotip Leeb impact device types.

• Impact device cable 1.5 m: This cable serves as the communication link between the impact device C and the Equotip measuring instrument (display unit). It transmits the electrical signals generated during the impact and rebound phases to the instrument, where they are processed to determine and display the hardness value. The 1.5-meter length offers a practical working distance for the operator.

Applications:

The Equotip Leeb impact device C is particularly well-suited for hardness testing in applications where a smaller indentation or lower impact energy is desired, such as:

• Testing of thin sheets and foils

• Measurement of surface coatings and hardened layers

• Evaluation of materials with low mass or susceptibility to indentation

• Testing of components with complex geometries or limited access