NM01S112103/2
Choose Quantity
ADELIX — S112-10-3/2 Dual Ultrasonic Transducer (10 MHz, 3 mm)
High-Resolution Dual Element UT Probe | Potted Design SKU: S112-10-3/2Overview
The ADELIX S112-10-3/2 is a high-frequency dual-element ultrasonic transducer designed for precision thickness measurement and near-surface inspection. Operating at 10 MHz with a 3 mm element size, this probe delivers excellent resolution, making it ideal for thin materials and applications requiring detection of small discontinuities.
Its dual-element configuration enhances near-surface performance by separating transmit and receive functions, allowing accurate measurements even on coated or rough surfaces. The potted construction provides added durability and environmental protection, ensuring reliable operation in demanding inspection conditions.
Engineered for compatibility with ultrasonic thickness gauges and flaw detectors, the S112-10-3/2 is well-suited for industries such as aerospace, manufacturing, and precision engineering where high-resolution measurements are critical.
What's Included
| Item | Details |
|---|---|
| Dual UT Transducer | 10 MHz, 3 mm dual-element probe — potted design |
| Connector | Standard UT connector (model dependent) |
| Protective Case | Storage and transport protection (if applicable) |
Box Dimensions & Shipping Weight (Estimated)
| Parameter | Imperial |
|---|---|
| Length | 6.0 in |
| Width | 4.0 in |
| Height | 3.0 in |
| Dimensions (L × W × H) | 6.0 × 4.0 × 3.0 in |
| Weight | 0.5 lb |
Key Specifications
| Parameter | Details |
|---|---|
| Probe Type | Dual-element ultrasonic transducer |
| Frequency | 10 MHz |
| Element Size | 3 mm |
| Construction | Potted |
| Configuration | Dual element (transmit/receive) |
| Application | Precision thickness measurement and flaw detection |
Performance Features
High-Frequency Resolution
10 MHz operation provides excellent sensitivity for detecting small defects and measuring thin materials.
Dual-Element Design
Improves near-surface resolution and enables accurate readings on coated or irregular surfaces.
Compact Element Size
3 mm diameter allows inspection in small or confined areas with high precision.
Durable Potted Construction
Encapsulated design protects internal components and ensures long-term reliability.
User-Friendly Design
- Easy connection to compatible UT instruments
- Compact and lightweight for precise handling
- Suitable for detailed inspection work
- Designed for both field and laboratory use
Built for Industrial Environments
- Durable construction for demanding applications
- Designed for precision inspection tasks
- Reliable performance under continuous use
- Suitable for high-accuracy measurement environments
Compatibility
Compatible with:
- Ultrasonic thickness gauges
- Dual-element UT systems
- Precision inspection workflows
- Industrial and laboratory testing equipment
Ideal Applications
- Thickness measurement of thin materials
- Near-surface flaw detection
- Precision component inspection
- Aerospace and high-spec manufacturing
- Quality control and maintenance inspections
- General ultrasonic testing (UT)
About ADELIX
ADELIX is a manufacturer of advanced inspection and diagnostic instruments, offering reliable solutions for ultrasonic testing, vibration monitoring, and industrial measurement applications. Their products are designed to support accurate and efficient inspection processes across a wide range of industries.