NM01PTOFDQ1501

Ultra-High Resolution 15 MHz TOFD Probe with Quick Change - Unrivaled Precision in Flaw Detection

This cutting-edge TOFD probe is designed for the most demanding ultrasonic inspections, utilizing the Time-of-Flight Diffraction technique with unparalleled precision. Featuring an innovative quick change style for maximum operational efficiency, this transducer boasts an exceptionally high 15 MHz frequency and an ultra-small 0.125" (3.18 mm) diameter, delivering the ultimate in resolution and sensitivity for detecting the smallest imperfections.

The ultra-short 1-1/2 cycle pulse length provides unmatched axial resolution, critical for detailed analysis of closely spaced defects and complex flaw morphologies. Equipped with a secure microdot connector and a non-composite element for the cleanest, sharpest pulse, this probe is the pinnacle of performance for critical applications requiring the highest level of flaw detection and characterization in thin materials and intricate geometries. The quick-change capability ensures maximum throughput in fast-paced inspection environments.

Key Benefits:

• Ultimate Resolution: 15 MHz frequency for detecting the smallest detectable flaws.

• Unmatched Axial Resolution: Ultra-short 1-1/2 cycle pulse for the most precise defect separation.

• Efficient Operation: Quick change design minimizes downtime.

• Exceptional Detail: Ultra-small 0.125" diameter for highly focused inspections.

• Reliable Connection: Microdot connector ensures optimal signal integrity.

• Cleanest Pulse: Non-composite element for the highest possible resolution.

Applications:

• Ultra-high resolution weld inspection using TOFD.

• Detection and characterization of extremely small defects in critical components.

• Inspection of very thin-walled materials where maximum resolution is paramount.

• Applications requiring the highest possible near-surface resolution.

• Advanced automated and semi-automated TOFD inspection systems demanding the highest precision.