NM01BEX01C

The DELAY LINE - PENCIL STYLE, REMOVABLE TIP - 12MHz, .187" DIA, manufactured by NDT SYSTEMS, is a precision-engineered ultrasonic delay line designed for critical near-surface inspections and challenging ultrasonic testing (UT) applications. This delay line is meticulously crafted to introduce a specific time delay into the ultrasonic signal path, enhancing flaw detection capabilities and improving overall inspection accuracy.

The "pencil style" design offers a slim, ergonomic profile, allowing for easy access to confined spaces and intricate geometries. This design is particularly advantageous in applications where traditional transducers and delay lines may be too bulky.

A key feature of this delay line is its removable tip. This allows for convenient replacement of the wear surface, extending the lifespan of the delay line and minimizing downtime. Interchangeable tips can also be used to achieve different delay lengths or contact surface configurations, providing versatility for various inspection requirements.

Operating at a frequency of 12MHz, this delay line is optimized for high-resolution inspections, enabling the detection of minute flaws and discontinuities. The .187-inch diameter further enhances its suitability for detailed inspections in restricted areas.

Manufactured by NDT SYSTEMS, a reputable provider of NDT equipment and accessories, this delay line is built to meet stringent quality standards and performance specifications. Its robust construction and reliable performance make it an indispensable tool for professionals in various industries, including aerospace, manufacturing, and maintenance.

Key Features and Benefits:

• Pencil Style Design: Enables access to confined spaces and intricate geometries.

• Removable Tip: Allows for easy replacement and extended lifespan.

• 12MHz Frequency: Optimized for high-resolution inspections.

• .187" Diameter: Enhances access to restricted areas.

• NDT SYSTEMS Quality: Manufactured to high-quality standards.

• Improved Near-Surface Flaw Detection: Enhances signal resolution.

• Versatile Application: Suitable for various UT inspection requirements.

Applications:

• Near-surface flaw detection in various materials.  

• High-temperature inspections (with appropriate tip materials).

• Thin material thickness measurement.

• Confined space inspections.

• General ultrasonic testing (UT) applications.