NM01TSD22510
The (Likely OKO-NDT) Straight Beam Probe (Double Element) is a specialized ultrasonic transducer designed for contact-based, straight beam inspections utilizing the distinct advantages of a dual-element (pitch-catch) configuration. This probe operates with a center frequency of 2.25 MHz, which is a lower frequency strategically chosen to provide enhanced penetration capabilities in thicker materials and those known to be more attenuating to ultrasonic waves. While offering good penetration, this frequency still provides adequate resolution for detecting a range of flaw sizes.
The active elements within the probe housing each have a diameter of 10mm. In a double element probe, one element acts as the transmitter, generating the ultrasonic pulse, while the other acts as the receiver, capturing the echoes returning from within the test material. This physical separation of the transmitting and receiving functions offers several key benefits over traditional single-element probes.
The probe is equipped with a standard Lemo 00 connector, ensuring secure and reliable electrical connection to a wide array of ultrasonic flaw detectors and thickness gauging instruments commonly used in non-destructive testing.
The dual-element design of this straight beam probe makes it particularly well-suited for applications where:
Enhanced Near-Surface Resolution is Required: By separating the transmitting and receiving elements, the interference from the initial excitation pulse and near-field noise is significantly reduced. This allows for improved detection and characterization of flaws located very close to the surface of the test piece – a common limitation of single-element probes.
Increased Sensitivity to Small Defects is Desired: The pitch-catch configuration can be more sensitive to scattered ultrasonic energy, making it effective for detecting small, distributed defects such as porosity, inclusions, and fine cracks, especially in materials that tend to scatter sound.
Accurate Thickness Gauging of Thin Materials is Necessary: In thin materials, the time separation between the initial pulse and the back wall echo is very short. The dual-element approach can provide more accurate and stable readings in these challenging scenarios by minimizing ring-down effects.
Inspection of Noisy or Attenuating Materials is Performed: The separated elements can improve the signal-to-noise ratio in materials that tend to scatter or absorb ultrasonic energy, leading to more reliable detection of relevant indications.
Important Considerations:
Focal Characteristics: While described as a straight beam probe, the overlapping sound fields of the transmitting and receiving elements create a pseudo-focused zone where sensitivity is optimized. The specific focal characteristics (focal length and beam profile) are important for effective inspection and would typically be detailed in the manufacturer's specifications.
Couplant Dependency: As with all contact ultrasonic testing, the use of a suitable couplant (such as ultrasonic gel) between the probe face and the test surface is essential to ensure efficient transmission of ultrasonic energy into the material.
Material Suitability: The 2.25 MHz frequency makes this probe a good choice for inspecting a range of materials, including metals, plastics, and composites, where moderate penetration and good near-surface resolution are required.
In summary, the (Likely OKO-NDT) Straight Beam Probe (Double Element) with its 2.25 MHz frequency, 10mm element diameter, and Lemo 00 connector, is a valuable tool for ultrasonic testing professionals seeking enhanced near-surface resolution and sensitivity in straight beam inspections. Its dual-element design makes it particularly advantageous for specific applications such as inspecting thin materials, detecting near-surface flaws, and evaluating materials with scattering characteristics, contributing to more comprehensive and reliable material evaluations.