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Sonatest — X3 Series Long Array Probe for Electronic Scanning
5 MHz 64-Element Phased Array Probe for Electronic Scanning Applications SKU: X3A-003Overview
The Sonatest X3 Series Long Array Probe is a professional phased array ultrasonic probe designed for electronic scanning applications in advanced NDT inspection workflows. Built for high-performance ultrasonic testing, this probe supports efficient coverage, improved inspection productivity, and reliable flaw detection across welds, components, and industrial materials.
The X3A-5M64E-06X10-SQX2.5 configuration is part of Sonatest’s X3 Series long array probe lineup and is designed around a 5 MHz, 64-element format. This makes it suitable for phased array inspection applications where electronic scanning, controlled beam steering, and repeatable data acquisition are required.
Engineered for professional field and shop use, the X3 Series long array probe helps inspection teams perform advanced ultrasonic inspections with consistent coverage, reduced scanning time, and dependable performance in demanding industrial environments.
What's Included
| Item | Details |
|---|---|
| Phased Array Probe | Sonatest X3 Series long array probe |
| Probe Model | X3A-5M64E-06X10-SQX2.5 |
| Frequency | 5 MHz |
| Elements | 64 elements |
| Application | Electronic scanning |
| Documentation | Product documentation / certification, if included |
Box Dimensions & Shipping Weight (Estimated)
| Parameter | Imperial |
|---|---|
| Length | 12.0 in |
| Width | 8.0 in |
| Height | 5.0 in |
| Dimensions (L × W × H) | 12.0 × 8.0 × 5.0 in |
| Weight | 2.0 lb |
Key Specifications
| Parameter | Details |
|---|---|
| Product Type | Phased array ultrasonic probe |
| Series | X3 Series |
| Probe Style | Long array probe |
| Model | X3A-5M64E-06X10-SQX2.5 |
| Frequency | 5 MHz |
| Element Count | 64 elements |
| Scanning Type | Electronic scanning |
| Application | Advanced ultrasonic inspection |
| Manufacturer | Sonatest |
| SKU | X3A-003 |
Performance Features
Long Array Probe Design
Provides extended inspection coverage for efficient electronic scanning and advanced ultrasonic testing workflows.
5 MHz Inspection Frequency
Offers a practical balance of resolution and penetration for a wide range of industrial inspection applications.
64-Element Phased Array Format
Supports controlled beam formation, electronic scanning, and repeatable inspection data acquisition.
Advanced UT Inspection Support
Designed for professional phased array inspections requiring accuracy, coverage, and productivity.
User-Friendly Design
Long array format supports efficient inspection coverage
Designed for electronic scanning workflows
Suitable for integration with compatible phased array systems
Supports repeatable setup and inspection procedures
Practical for advanced NDT field and shop applications
Built for Industrial Environments
Durable probe construction for professional inspection use
Suitable for fabrication, maintenance, and QA/QC environments
Built for repeated phased array inspection workflows
Reliable performance for demanding ultrasonic testing applications
Designed for advanced NDT inspection teams
Compatibility
Compatible with:
Phased array ultrasonic testing systems
Electronic scanning inspection workflows
Long array phased array probe setups
Weld and component inspection procedures
Advanced ultrasonic flaw detection applications
Sonatest phased array inspection platforms and accessories
Ideal Applications
Phased array ultrasonic testing
Electronic scanning inspections
Weld inspection and evaluation
Flaw detection and sizing
Component and material inspection
Fabrication QA/QC
Maintenance and asset integrity programs
Advanced industrial NDT workflows
About Sonatest
Sonatest is a global leader in ultrasonic testing technology, providing advanced flaw detectors, thickness gauges, phased array systems, TOFD solutions, probes, wedges, scanners, and inspection accessories for professional NDT applications. Their products are trusted worldwide for accuracy, reliability, and performance in demanding industrial inspection environments.