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Leeb — Probe C Impact Device
Specialized Leeb Hardness Probe for Small, Light, Thin Parts & Hardened Layers SKU: PROBECOverview
The Leeb Probe C Impact Device is a specialized hardness testing accessory designed for use on small, light, thin components and hardened surface layers. Built for dynamic Leeb hardness testing, this probe provides controlled impact energy for applications where standard impact devices may be too aggressive or unsuitable.
Its C-type configuration is ideal for delicate parts, thin-walled materials, surface-hardened components, and areas where minimal indentation is required. This makes it especially useful in precision manufacturing, heat treatment verification, and quality control workflows.
Designed for compatibility with Leeb hardness testing systems, the Probe C supports accurate and repeatable hardness measurements in applications requiring greater sensitivity and reduced test impact.
What's Included
| Item | Details |
|---|---|
| Impact Device | Probe C Leeb hardness impact device |
Box Dimensions & Shipping Weight (Estimated)
| Parameter | Imperial |
|---|---|
| Length | 8.0 in |
| Width | 6.0 in |
| Height | 3.0 in |
| Dimensions (L × W × H) | 8.0 × 6.0 × 3.0 in |
| Weight | 0.8 lb |
Key Specifications
| Parameter | Details |
|---|---|
| Product Type | Leeb impact device |
| Probe Type | C impact device |
| Application | Hardness testing |
| Suitable Materials | Small, light, and thin parts |
| Special Use | Hardened surface layers |
| Method | Dynamic Leeb hardness testing |
| SKU | PROBEC |
Performance Features
Optimized for Delicate Parts
Designed for small, light, and thin components where standard probes may not be suitable.
Reduced Impact Energy
Helps minimize indentation while maintaining reliable hardness measurement.
Hardened Layer Testing
Useful for checking surface-hardened or heat-treated layers.
Repeatable Measurement Performance
Supports consistent hardness readings in precision inspection workflows.
User-Friendly Design
- Easy connection to compatible Leeb testers
- Compact and lightweight probe body
- Suitable for detailed inspection work
- Designed for efficient quality control workflows
Built for Industrial Environments
- Durable construction for repeated testing
- Reliable performance in shop and field applications
- Suitable for precision manufacturing and maintenance
- Designed for professional hardness testing workflows
Compatibility
Compatible with:
- Leeb hardness testers
- Dynamic hardness testing systems
- Small part inspection workflows
- Heat treatment verification programs
Ideal Applications
- Small component hardness testing
- Thin material inspection
- Surface hardening verification
- Heat-treated layer evaluation
- Precision manufacturing QA/QC
- Maintenance and material verification
About the Product
The Probe C Impact Device is designed to expand Leeb hardness testing capability into delicate, thin, and surface-hardened applications, helping inspectors achieve reliable measurements where standard impact devices may not be appropriate.