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Leeb — Probe D Standard Impact Device
General-Purpose Leeb Hardness Probe for Portable Hardness Testing SKU: PROBEDOverview
The Leeb Probe D Standard Impact Device is a general-purpose hardness testing accessory designed for dynamic Leeb hardness measurement. As the standard impact device used in many portable hardness testing systems, Probe D provides reliable performance for a wide range of metallic materials and industrial components.
Its standard configuration makes it suitable for routine hardness testing on larger, heavier parts where stable support and proper test conditions can be achieved. The probe delivers repeatable impact energy for consistent rebound measurement, helping inspectors verify material hardness quickly and efficiently.
Built for field, shop, and maintenance environments, the Probe D is ideal for quality control, material verification, heat treatment checks, and general industrial hardness testing applications.
What's Included
| Item | Details |
|---|---|
| Impact Device | Probe D standard Leeb hardness impact device |
Box Dimensions & Shipping Weight (Estimated)
| Parameter | Imperial |
|---|---|
| Length | 8.0 in |
| Width | 6.0 in |
| Height | 3.0 in |
| Dimensions (L × W × H) | 8.0 × 6.0 × 3.0 in |
| Weight | 0.8 lb |
Key Specifications
| Parameter | Details |
|---|---|
| Product Type | Leeb impact device |
| Probe Type | D standard impact device |
| Application | Hardness testing |
| Method | Dynamic Leeb hardness testing |
| Use Type | General-purpose |
| SKU | PROBED |
Performance Features
Standard Leeb Testing Configuration
Designed for general-purpose hardness testing across common industrial applications.
Reliable Rebound Measurement
Provides consistent impact performance for repeatable hardness readings.
Versatile Material Testing
Suitable for a wide range of metallic materials and components.
Field-Ready Performance
Supports quick hardness checks in shop, field, and maintenance environments.
User-Friendly Design
- Easy connection to compatible Leeb testers
- Standard probe configuration for routine testing
- Compact and practical for field use
- Designed for efficient quality control workflows
Built for Industrial Environments
- Durable construction for repeated testing
- Reliable performance in shop and field applications
- Suitable for maintenance and production inspection
- Designed for professional hardness testing workflows
Compatibility
Compatible with:
- Leeb hardness testers
- Dynamic hardness testing systems
- Standard hardness testing workflows
- Material verification and QA/QC programs
Ideal Applications
- General hardness testing
- Material verification
- Heat treatment inspection
- Manufacturing quality control
- Maintenance and repair operations
- Industrial component testing
About the Product
The Probe D Standard Impact Device is designed to provide dependable, general-purpose Leeb hardness testing performance, making it a practical accessory for routine material inspection and portable hardness measurement applications.
