NM01PTOFDQ1002

High-Resolution 10 MHz TOFD Probe with Quick Change - Precision Flaw Detection

This advanced TOFD probe is engineered for high-precision ultrasonic inspections using the Time-of-Flight Diffraction technique. Featuring a quick change style for maximum efficiency during demanding inspection sequences, this transducer boasts a 10 MHz frequency and a small 0.250" (6.35 mm) diameter, delivering exceptional resolution and sensitivity for detecting even minute flaws.

The short 1-1/2 cycle pulse length further enhances axial resolution, crucial for accurately characterizing closely spaced defects. Equipped with a reliable microdot connector and utilizing a non-composite element for a clean, sharp pulse, this probe is ideal for critical applications requiring detailed flaw detection and sizing in a variety of materials and geometries. Its quick-change capability minimizes downtime, making it a valuable asset for fast-paced inspection environments.

Key Benefits:

• High Resolution: 10 MHz frequency for detecting small flaws.

• Excellent Axial Resolution: Short 1-1/2 cycle pulse for precise defect characterization.

• Quick Change Design: Minimizes downtime during probe swaps.

• Compact Size: 0.250" diameter for inspections in restricted areas.

• Reliable Connection: Microdot connector ensures secure signal transmission.

• Clean Pulse: Non-composite element for optimal resolution.

Applications:

• High-resolution weld inspection using TOFD.

• Detection and sizing of small defects in various materials.

• Inspection of thin-walled components.

• Applications requiring excellent near-surface resolution.

• Use in automated and semi-automated TOFD inspection systems.